X-RAY

In X-ray fluorescence(XRF),energy-dispersive spectroscopy(EDS),and electron microscopy applications,detector peformance is fundamentally limited by temperature-sensitive noise mechanisms.

Leakage current and electronic noise increase rapidly with temperature.

Even a1℃temperature fluctuation can cause a significant rise in noise,leading to:

1.Degraded energy resolution

2.Peak broadening and overlap of adjacent elemental lines

3.Reduced peak-to-background ratio

4.Poor accuracy and repeatability in elemental identification

Precise and stable temperature control is therefore a prerequisite for high-resolution X-ray detection.

By actively cooling and stabilizing the detector at-20℃to-60℃,TEC cooling enables:

1.Energy resolution optimized to~125 [email protected] keV

2.Peak-to-background ratio improved by 3-5×

3.Lower detection limits reaching ppm level

4.Narrower spectral peaks and clearer elemental separation

5.Stable detector behavior during long measurement cycles

1.Solid-state design with no moving parts→high reliability and long lifetime

2.Zero vibration operation→no impact on spectral stability

3.Precise temperature control(±0.1℃typical)→consistent energy calibration

4.Compact and integrable→suitable for TO-8 and other miniature detector packages

5.Orientation-independent and maintenance-free→ideal for laboratory and field instruments

The following models represent typical multi-stage TEC models commonly used in X-ray detectors applications.They are provided for reference and comparison only,not as a complete product list.